De alles-in-één elektronenmicroscoop die datakwaliteit combineert met intuïtieve bediening
De instrumenten in de ZEISS EVO-serie combineren hoogwaardige scanelektronenmicroscopie met een intuïtieve, gebruiksvriendelijke ervaring die zowel experts als nieuwe gebruikers aanspreekt. Met zijn uitgebreide reeks beschikbare opties kan ZEISS EVO precies worden afgestemd op uw vereisten - ongeacht of u actief bent op het gebied van materiaalwetenschappen of routinematige industriële kwaliteitsborging en storingsanalyse.
Een veelzijdige multifunctionele oplossing
Beste bruikbaarheid in zijn klasse
Uitstekende beeldkwaliteit
Automatisering van workflows en gegevensintegriteit
ZEISS EVO is het conventionele instapsysteem, met een gloeidraad op basis van wolfraam of LaB6, voor dagelijkse herhaalbare beeldvormingstaken, bijv. materiaalanalyse met hoge resolutie, met grotendeels geautomatiseerde en ondersteunende workflows. Het systeem biedt flexibiliteit voor minder veeleisende structuurformaten.
Toepassingsgebieden
Kwaliteitsanalyse en kwaliteitscontrole
Foutenanalyse en fractografie
Materialografie
Reinheidsinspectie
Morfologische en chemische analyse van deeltjes om te voldoen aan ISO 16232 en VDA 19 Deel 1 & 2 normen
Analyse van niet-metalen insluitsels
ZEISS EVO: de alles-in-één elektronenmicroscoop die datakwaliteit combineert met intuïtieve bediening
Til uw inspectie naar een hoger niveau. ZEISS EVO biedt u een menu met configuratie-opties om precies aan uw prijs- en prestatievereisten te voldoen. Stem de gewenste resolutie af op uw toepassing en kies uit drie kamergroottes.
Je kunt ook kiezen voor hoog vacuüm, variabele druk of omgevingsdruk, afhankelijk van het type monster. Kies vervolgens uit SE-, BSE-, EDX-, VP- en C2D-detectoren die passen bij uw toepassing. Met ZEISS EVO geniet u van de voordelen van elektronenmicroscopie tegen een betaalbare prijs.
Toepassingsvoorbeelden
Elektronica
Puin en vervuiling zijn duidelijk zichtbaar op het oppervlak van een geïntegreerd circuit. Afgebeeld met de SE-detector in hoog vacuüm bij 10 kV.
Brandstofcellen
Brandstofcellen bestaan meestal uit polymeer elektrolytmembranen tussen platina elektroden. Deze kritieke onderdelen moeten worden afgebeeld bij lage voltages om ervoor te zorgen dat informatie over oppervlakdetails wordt verkregen bij een hoge resolutie. Doorsnede met een LaB6-bron (links) en wolfraambron (rechts) bij 3 kV. LaB6-bron biedt meer oppervlakdetail bij lage versnellingsspanningen.
Gegalvaniseerd zacht staal
Dwarsdoorsnede van gegalvaniseerd zacht staal, in beeld gebracht met de SE-detector op de ZEISS EVO 15. Links: montagehars; midden: zinklaag; rechts: zacht staal.
Materiaalanalyse met röntgenspectroscopie (EDX)
BSE-afbeeldingen van representatieve gecorrodeerde oppervlakken met EDS-kaart: chroom, lood, koper, nikkel, carbonium en zuurstof.
Faalanalyse aan het oppervlak van een kogellager
Het oppervlak van het kogellager, afgebeeld met de BSE-detector, vertoont barsten en afschilfering van de oppervlakstructuur.
Technische reinheid
Deeltje van een deeltjesfilter: technische reinheidsanalyse en kwaliteitscontrole.
ZEISS EVO scanelektronenmicroscoop - 10 hoogtepunten in 90 seconden
Inhoud van derden geblokkeerd
De videospeler is geblokkeerd vanwege uw trackingvoorkeuren. Om de instellingen te wijzigen en de video af te spelen, dient u op de onderstaande knop te klikken en in te stemmen met het gebruik van "functionele" trackingtechnologieën.
Ontdek hoe de scanelektronenmicroscoop ZEISS EVO uw routinematige inspectie- en foutanalysetaken in kwaliteits- en materiaallaboratoria ondersteunt door intuïtieve beeldvorming mogelijk te maken, zelfs voor beginnende gebruikers. Highlights van EVO: - Beeldvorming met hoge resolutie - Efficiënte bediening - Analyse van chemische samenstelling - Grote werkstukken - Beeldregistratie over grote oppervlakken - Niet-geleidende monsters - EDX-deeltjesanalyse - Geautomatiseerde metingen - Intelligente beeldsegmentatie - Beeldcorrelatie en -deling
Verdere toepassingen voor de industrie:
fase-, deeltjes- en lasanalyse
Visuele inspectie van elektronische componenten, geïntegreerde circuits, MEMS-apparaten en zonnecellen
Onderzoek van koperdraadoppervlak en kristalstructuur
Metaalcorrosieonderzoek
Analyse van intermetallische fases en faseovergangen
Beeldvorming en analyse van microscheuren en breuksterkte
Onderzoeken naar coatings en composietmaterialen
Onderzoek van lasnaden en warmte-beïnvloede zones
Met de ZEISS EVO vinden we de speld in de hooiberg.
De naald in de hooiberg vinden.
Technische reinheid: de INNIO Group analyseert de chemische samenstelling van achtergebleven vuildeeltjes met behulp van een ZEISS-oplossing.
Inhoud van derden geblokkeerd
De videospeler is geblokkeerd vanwege uw trackingvoorkeuren. Om de instellingen te wijzigen en de video af te spelen, dient u op de onderstaande knop te klikken en in te stemmen met het gebruik van "functionele" trackingtechnologieën.
Nauwkeurige, betrouwbare resultaten zijn natuurlijk belangrijk, maar het is ook belangrijk om ze snel te krijgen,
Microscopietoepassingen voor kwaliteitsborging:
klantvoorbeelden en brochure uit de branche voor de branche
ZEISS IQS, Mic and TCA, Success Story, INNIO Group, EN, PDF
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